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Michelson
Interferometer |
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◆ Knowledge
Introduction |
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Michelson Interferometer
is an optical precision
instrument used to
research spectroscopy
and metrology, which is designed by A.Michelson and
E.W.Morley in 1883. It
can be used to measure
tiny length and changes
accurately.
Various special
interference instruments
by using the principle
are widely used in many
fields such as
production and
scientific research.
In this experiment, the
students can understand
the principle of
Michelson Interferometer
and the conception of
equal inclination
interference, master the
way
to measure wavelength
and the thickness of
filmy dielectric. |
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Main points:
Structure, principle and
adjustment of Michelson
Interferometer
Phenomenon of equal
inclination interference
observation, length of
inclination interference
measurement
Wavelength
of monochromatic light to
measure
Thickness of filmy
dielectric measurement |
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Experimental device |
Michelson Interferometer
beam path |
Interference pattern |
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◆ Related
Courses |
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Physical
Optics, Laser Device, Optical
Instruments, Application Optics,
Engineering Optics |
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◆ Basic
Configurations |
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Name |
Specifications |
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Laser |
Visible wavelength
selectable（Include
current source） |
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Michelson Interferometer |
Plane mirrors: M1、M2
Spectroscopic board: G1
Compensating board: G2 |
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Photodetector |
receiving screen |
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Others |
Slideway, baffle, laser
goggle |
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◆ Expanding Experiments |
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◆ Applications of Instrument |
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The refractivity of
transparent medium
measurement
Accurately measurement of airflow
Plasma measurement |
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Equal inclination
interference, equal
thickness interference,
white light interference observation
The thickness of the
coating measurement, the
refractivity of
air measurement
The research on fine
structure of spectral line |
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