Customer Service

国内: 0431-87020257 / 89216068

(Ultra) Low-Noise Test System

Currently, the SLFN-2000 (Ultra)Low-Frequency Noise Test System has been successfully deployed at multiple scientific institutions including: Changchun Institute of Applied Chemistry、Changchun University of Science and Technology、Nanjing University、Jiangnan University、Henan Normal University、Southwest University、Xiamen University.

■ Low-Noise Test System

    Key technical specifications
               fA-level I-V Curve Scanning
               Noise floor:10^-28 A²Hz或10^-32 A²/Hz
               Supporting both two-terminal and three-terminal testing
               Exceptional cost-performance ratio with integrated probe station
               User-friendly software interface with intuitive workflow
               Dynamic averaging with real-time visualization (up to 500 averages)
               Flexible data processing and one-click export
　

     Product Application Directions
              1/f Noise Testing and Analysis
              RTN Testing and Characterization
              DC Current Measurement (500 fA resolution)
              Quantum Efficiency and Responsivity Characterization
              Optical Response Time (500 ns transient analysis)
              Reliability Non-Destructive Evaluation (NDE)
              Integrated Micro-Probe Station
              I-V (Current-Voltage) and I-T (Current-Time) Scanning
              Photocurrent and Dark Current Profiling

■ Specification

  Model 

  SLFN-2000

  Bias Voltage Range

  ±10

  Current Resolution

  <500fA or <1fA

  Frequency Range

  0.1Hz-100 KHz or 0.01Hz-10Hz

  Signal Output Range

  0.2 V、1 V、5 V、10 V

  Current Amplification Factor

  10³-10¹¹或10⁵-10¹³

  System Noise Floor

  10^-28 A²/Hz(low frequency) or
10^-32 A²/Hz (ultra-low frequency)

  Data Averaging Modes

  RMS、Vector、Peak

■ Interface

■ Product measurement data display

Photocurrent, dark current

Ultra-low frequency 1/f noise