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M² Measurement System

CNI proudly introduces its advanced M² Measurement System, featuring a compact, all-in-one design integrated with a high-precision motorized translation stage and a high-resolution beam profiler for capturing beam profiles. The system utilizes independently developed analysis software to accurately measure critical beam quality parameters, including: M² factor, beam divergence angle, focus diameter, beam waist position, Rayleigh length, and other essential characteristics.

Engineered to achieve an overall accuracy within ±5%, the system meets rigorous demands for beam quality analysis. It is widely applicable in laser technology, fiber-optic communications, biomedical research, and laser-based manufacturing. With short lead times, responsive after-sales support, and high cost-effectiveness, it is an economical and efficient alternative to imported beam quality analyzers.

■ M² Measurement System

• Manufacturing
• Scientific Research
• Defense & Aerospace
• Medical & Life Sciences
  　

• Capable of measuring the quality of continuous and pulsed laser beams
• Spectral detection range 340-1100nm
• Detection accuracy 5%
• Easy to operate, fast one click measurement

■ Specification

  Model 

  CN0310VIS-M2-B

  Operating Wavelength

  340-1100 nm

  M² Measurement Range 

  1 -50

  Max Input Spot Size 

  ≤5 mm @ 355 nm (1/e²)
  ≤7.5 mm @ 532 nm (1/e²)
  ≤10 mm @ 1064 nm (1/e²)

  Measurement Accuracy

  ≤5%

  Focus Position Accuracy

   ±10%

  Pixel Size

  3.2 μm

  Max Resolution 

  2448 × 2448 pixels

  Laser Power Handling 

  CW: 1 μW – 10 W/cm²
  Pulsed: 10 μJ – 10 mJ/cm²

  Bit Depth

  12-bit

  Attenuator

  OD0.5 / OD1 / OD1.5 / OD2 / OD3 / OD4

  Interface 

  USB 3.0

  Scanning Range

  200 mm travel (Double optical path length)

  Repositioning Accuracy

  ±5 μm

  Controller

  RS232 interface, dual-axis motorized stage

  Weight 

  <15 kg

  Dimensions 

  500 × 250 × 175 mm (reference design)

■ Operating  Software