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CNI proudly introduces its advanced
M² Measurement System, featuring a compact, all-in-one design
integrated with a high-precision motorized translation stage and
a high-resolution beam profiler for capturing beam profiles. The
system utilizes independently developed analysis software to
accurately measure critical beam quality parameters, including:
M² factor, beam divergence angle, focus diameter, beam waist
position, Rayleigh length, and other essential characteristics.
Engineered to achieve an overall accuracy within ±5%, the system
meets rigorous demands for beam quality analysis. It is widely
applicable in laser technology, fiber-optic communications,
biomedical research, and laser-based manufacturing. With short
lead times, responsive after-sales support, and high
cost-effectiveness, it is an economical and efficient
alternative to imported beam quality analyzers. |
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Specification |
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Model
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CN0310VIS-M2-B |
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Detection Wavelength |
340-1100 nm |
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M²
Range |
1 -50 |
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Minimum Input Beam
Diameter |
≤1.0 mm @ 355 nm
(1/e²)
≤1.2 mm @ 532 nm (1/e²)
≤1.6 mm @ 1064 nm (1/e²) |
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Maximum Input Beam
Diameter |
≤7.0 mm @ 355 nm
(1/e²)
≤10.0 mm @ 532 nm (1/e²)
≤16.0 mm @ 1064 nm (1/e²) |
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Detection Accuracy |
<3% |
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Laser Focal Position Accuracy |
±10% |
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Maximum Input Power |
<1W |
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Detection Mode |
Automatic measurement after
parameter initialization |
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Typical Detection Time |
≤60s (excluding
initialization time)
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Attenuation Value |
OD0.5/OD1/OD1.5/OD2/OD3,automatic
switching |
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Interface |
USB 3.0 |
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Travel |
200mm,double
optical path |
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Repeat Positioning Accuracy |
±5 μm |
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Controller |
RS232 interface, dual-axis |
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Weight |
<15 kg |
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Dimensions |
467.37*130*177.56(LWH, excluding
feet) |
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Datasheet |
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Operating
Software |
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