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STA-LFNT (Ultra-)Low-Frequency Noise
Test System is primarily applied in the fields of physics,
materials science, and semiconductor materials and devices. It
is capable of testing photodetectors, two-dimensional emerging
functional material devices, sensors, and more.
Its functions include low-frequency noise testing,
(ultra-)low-frequency noise testing, and RTN (Random Telegraph
Noise) testing and characterization. By measuring data such as
1/f noise and noise power spectra, the system directly reveals
internal lattice defects, interface charge traps, and carrier
transport behaviors within the device, providing experimental
evidence for material composition optimization, device structure
design, and process improvement.
The system integrates a miniature optical platform, a low-noise
current amplifier, a spectrum analyzer, and an optical
microscope. Its core modules are sourced from imported brands to
ensure measurement accuracy.
To date, the STA-LFNT (Ultra-)Low-Frequency Noise Test System
has been adopted by numerous research institutions and
universities, including Tsinghua University, Nanjing University,
Harbin Institute of Technology, Dalian University of Technology,
Changchun Institute of Applied Chemistry (CIAC), Changchun
University of Science and Technology, Jiangnan University, Henan
Normal University, Southwest University, Xiamen University,
Ningbo University, University of South China, and Heilongjiang
University. |
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Features
fA‑level current
testing capability with excellent shielding
performance to reduce external electromagnetic
interference;
Repeat function enables simultaneous measurement
and display of curves under different
conditions;
Supports simultaneous saving in two formats:
image (bmp) and data (xls);
True 1/f noise measurement and analysis,
revealing the dynamic impacts of defects on
electric current;
Noise floor lower than 2×10⁻²⁹ A²/Hz (or 1×10⁻³¹
A²/Hz), enabling easy measurement of nA‑level
(or pA‑level) current noise;
One‑click switch between DC and AC modes, which
physically eliminates the influence of DC
components on 1/f curves;
Visual dynamic averaging; three data‑processing
methods including RMS, Vector and Peak, with up
to 500 averaging times;
On‑site selection of time‑domain data, automatic
fitting calculation and one‑click display of 3dB
bandwidth;
On‑line bad‑point removal function for better
defined curve patterns. |
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