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The STA-OPTS optoelectronic
detection system is mainly used in fields like physics,
materials science, and semiconductor materials. It can test
optoelectronic detectors, photovoltaic cells, semiconductor
thin-film devices, and more.
Its functions include a full set of tests such as IV
characteristics, IT scanning, photocurrent, optical power,
responsivity, quantum efficiency, photoresponse time, (ultra)
low-frequency noise, output and transfer characteristics, and
3dB bandwidth. By collecting data like device dark/light current
and response time, it intuitively reflects device defects and
material internal composition, providing a complete experimental
basis for optimizing material components, device structure
design, and improving fabrication processes.
The system includes a vibration-isolated optical platform, light
sources, monochromator, microscope, current amplifier, data
acquisition unit, testing software, and a computer control
terminal.
Currently, the STA-OPTS optoelectronic detection system has been
applied in research institutions and universities such as
Tsinghua University, Nanjing University, Harbin Institute of
Technology, Dalian University of Technology, Changchun Institute
of Applied Chemistry, Changchun University of Science and
Technology, Jiangnan University, Henan Normal University,
Southwest University, Xiamen University, Ningbo University,
Nanhua University, and Heilongjiang University. |
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Features
fA-level
current testing capability with excellent
shielding, reducing external electromagnetic
interference;
Automatically sets the incident monochromatic
wavelength, accurately scans dark current and
photocurrent curves;
Repeat function allows simultaneous measurement
and display of curves under different
conditions;
I(R)-T testing to characterize current changes
over time at fixed bias;
Dual Y-axis pulse I-V to show dynamic current
changes at different voltages;
Supports saving both image (bmp) and data (xls)
formats simultaneously;
True 1/f noise testing and analysis to reveal
defect effects on current dynamics;
Ultra-low noise below 2×10-29 A²/Hz (or
1×10-31 A²/Hz), easily testing nA-level (or pA-level)
current noise;
One-key switch between DC and AC, physically
removing DC components’ effect on 1/f curves;
Dynamic averaging visualization with RMS,
Vector, and Peak processing, up to 500 averages;
Power signal generator to modulate laser diodes,
current rise time under 50ns for fast optical
switching;
Multiple selectable current amplifier modules,
maximum photocurrent response time under 100ns;
Online selection of time-domain data, automatic
fitting and one-key display of 3dB bandwidth;
Online bad pixel deletion feature to make curve
trends clearer. |
